Sign In
Or
Sign Up
Home
Solution
Solution
IC Design & Wafer Processing
Specialty Process Fabrication
Analysis & Testing services
Products
About Us
Contact Us
Language
Get a Quote
Language
English
简体中文
Back
Home
Solution
Products
About Us
Contact Us
English
简体中文
Get a Quote
Login
Back
IC Design & Wafer Processing
Specialty Process Fabrication
Analysis & Testing services
English
简体中文
Get a Quote
Login
Home
Solution
IC Design & Wafer Processing
Specialty Process Fabrication
Analysis & Testing services
Products
About Us
Contact Us
English
简体中文
Language
English
简体中文
Get a Quote
Home
>
Products
>
Reliability and Failure Analysis Services
>
Equipment Name :SAT (Scanning Acoustic Microscope)
Equipment Name :SAT (Scanning Acoustic Microscope)
Main Test Items :
1.Delamination
2.Void
3.Crack
4. Interface debonding
GET A QUOTE
Download
View all downloads
Share
facebook
line
twitter
whatsapp
pinterest
tumblr
linkedin
Description
Inspection Images:
Feature Products
Visual Check: Cross-section
Visual Check: De-capsulation
Visual Check: AOI
Equipment Name :SAT (Scanning Acoustic Microscope)
Recently Viewed
Equipment Name :SAT (Scanning Acoustic Microscope)